Operational

Now

Source characteristics

5-cm-period undulator (U5) (first, third, and fifth harmonics)

Energy range

See endstation tables

Monochromator

See endstation tables

Endstations

Scanning photoemission microscope (SPEM)
Spin-resolved endstation (SPIN)
UltraESCA
Soft x-ray fluorescence spectrometer (SXF)

Beamline Phone Numbers

(510) 495-2070, (510) 495-2071, (510) 495-2079

Endstation

Scanning photoemission microscope (SPEM)

Characteristics

Designed for submicron XPS

Energy range

100-800 eV

Monochromator

SGM (gratings: 150, 380, 925 lines/mm)

Calculated flux (1.9 GeV, 400 mA)

~10⁸-10⁹ photons/s/0.01% BW

Resolving power (E/DE)

3000

Spatial resolution

Scanning microscope with focusing by means of Fresnel zone plates; resolution determined by spot size, which is 150 nm with current zone plates but will improve with new zone plates

Detectors

Hemispherical electron energy analyzer; total electron yield detector

Spot size at sample

150 nm with current zone plates

Samples

Format

UHV-compatible solids up to 25 mm in diameter

Preparation

Preparation chamber with sputtering and annealing provided

Sample environment

UHV

Special notes

Optical alignment equipment provided so that visible marks on the sample surface can be used to find an area of interest prior to x-ray measurements; in-situ heating and cooling

Experimental techniques

XPS, NEXAFS, imaging of areas up to 100 µm across

Local contact/Spokesperson

Name: Tony Warwick
Phone: (510) 486-5819
Fax: (510) 486-7696
Email: t_warwick@lbl.gov

Endstation

Spin-resolved endstation (SPIN)

Characteristics

Spin- and angle-resolved XPS spectroscopy; x-ray linear dichroism measurement

Energy range

60-1200 eV

Monochromator

SGM (gratings: 150, 380, 925 lines/mm)

Calculated flux (1.9 GeV, 400 mA)

~10¹² photons/s/0.01% BW (resolution dependent)

Resolving power (E/DE)

less than or equal to 8000

Spatial resolution

100 µm - 4 mm

Detectors

Hemispherical electron energy analyzer with Mini-Mott detector

Spot size at sample

~200 µm

Samples

Format

UHV-compatible solids up to 12 mm in diameter

Preparation

In-situ sputtering, sample heating and cooling (LN₂) available

Sample environment

UHV; sample-transfer system allows introduction of samples without venting chamber

Scientific applications

Condensed matter science, surface science

Experimental techniques

XPS, spin-resolved XPS, XMLDAD

Local contact

Name: Simon Morton
Phone: (510) 495-2926
Fax: (510) 486-7588
Email: SAMorton@lbl.gov

Spokesperson

Name: James Tobin
Affiliation: Lawrence Livermore National Laboratory
Phone: (925) 422-7247
Fax: (925) 423-7040
Email: tobin1@llnl.gov

Endstation

UltraESCA

Characteristics

High-resolution, angle-resolved XPS spectroscopy; capable of making images by rastering the sample through a fixed spot; sample is rotated for angle-resolved measurements

Energy range

60-1200 eV

Monochromator

SGM (gratings: 150, 380, 925 lines/mm)

Calculated flux (1.9 GeV, 400 mA)

~10¹² photons/s/0.01% BW (resolution dependent)

Resolving power (E/DE)

less than or equal to 8000

Spatial resolution

100 µm - 4 mm

Detectors

Hemispherical electron energy analyzer; total electron yield detector

Spot size at sample

50 µm

Samples

Format

UHV-compatible solids up to 25 mm in diameter

Preparation

Preparation chamber with sputtering is provided

Sample environment

UHV

Special notes

LEED and in-situ sample heating and cooling available

Scientific applications

Condensed matter science, surface science

Experimental techniques

XPS, XPD, NEXAFS

Local contact/Spokesperson

Name: Eli Rotenberg
Phone: (510) 486-5975
Fax: (510) 486-7696
Email: erotenberg@lbl.gov

Endstation

Soft x-ray fluorescence spectrometer (SXF)

Characteristics

Grating spectrometer for high-resolution (1:3000) photon-in/photon-out spectroscopy

Energy range

50-1200 eV

Monochromator

SGM (gratings: 150, 380, 925 lines/mm)

Calculated flux (1.9 GeV, 400 mA)

3 x 10¹² photons/s/0.01% BW (at 800 eV)

Resolving power (E/DE)

1800 (at 800 eV)

Detectors

Channel-plate photon counter in spectrometer focal plane

Spot size at sample

50 µm

Samples

Format

Solids or gases in windowed cell

Preparation

No preparation chamber provided

Sample environment

UHV

Special notes

This spectrometer is installed by the group from the University of Uppsala, Sweden. Potential users are asked to contact Professor Nordgren to explore possible collaborations.

Experimental techniques

Photon-in/photon-out spectroscopy

Local contact

Name: Jinghua Guo
Phone: (510) 495-2230
Email: jguo@lbl.gov

Spokesperson

Name: Professor Joseph Nordgren
Affiliation: Uppsala University, Sweden
Phone: 46-18-471-3554
Fax: 46-18-471-3524
Email: joseph@fysik.uu.se