Operational

Now

Source characteristics

Bend magnet

Energy range

0.002-3 eV

Frequency range

15-25,000 cm^-1

Interferometer resolution

0.125 cm^-1

Endstations

Bruker IFS66v/S FTIR (vacuum)

Characteristics

Rapid- and step-scan FTIR, down to 5 ns time resolution, reflection and transmission modes

Spatial resolution

Diffraction limited (~wavelength)

Detectors

Silicon bolometer (LHe cooled)
Wide-range MCT (mercury cadmium telluride)
Gap diode
Silicon diode
Fast silicon diode
DTGS mid-IR
DTGS far-IR

Spot size at sample

1 mm (varies with coupling optics)

Samples

Preparation

Stereo microscope and table, KBr press, IR cards, ALS user wet and biological labs available

Sample environment

Air or 10^-2 Torr in main FTIR bench sample compartment. LHe cryostat available for sample temperatures of 2-475 K. Chopped Ar laser available via fiber optic for photoexcitation.

Scientific applications

Strongly correlated systems, submonolayers on surfaces, polymers, semiconductors, superconductors, environmental samples, forensic studies, etc.

Local contact

Name: Michael C. Martin
Phone: (510) 495-2231
Fax: (510) 495-2067
Email: mcmartin@lbl.gov

Spokesperson

Name: Wayne R. McKinney
Affiliation: Advanced Light Source, Berkeley Lab
Phone: (510) 486-4395
Fax: (510) 486-7696
Email: wrmckinney@lbl.gov

Beamline Phone Number

(510) 495-2014