Programme

P.9 -- Poster, VCTP-48

Date: Tuesday, 1 August 2023

Time: 08:30 - 10:00

Ionized-impurity limited electron mobility in core-shell cylindrical semiconductor quantum wires

Nguyen Nhu Dat

Duy Tan University

Electron mobility limited by scattering from ionized impurities has been theoretically investigated for cylindrical semiconductor quantum wires with core-shell structure. Electron screening and dielectric constant mismatch of the core ($\epsilon_1$) and the shell ($\epsilon_2$) materials were taken into account. The mobility was obtained using the memory function approach. The results show that the remote impurity-limited mobility depends on the location of the impurity sheet in the shell. The closer the impurity sheet is to the wire surface, the higher the electron mobility, which can be up to four times greater. The electron mobility is higher for wires coated with a shell, the dielectric constant of which is greater than the dielectric constant of the core. It has also been shown that electron screening weakens with increasing core radius and coating shell thickness, while the mobility, on the contrary, increases. This is due to the greater rate of fall of the impurity potential than the rate of decrease of the electron screening when changing these wire parameters.

Presenter: Nguyen Nhu Dat