KC-02-01-01
Studies of Nanoscale Structure and Structural Defects of Advanced
Materials (Y. Zhu)
BNL 66430-AB: Cai, Z.-X. and Zhu, Y.
Micromagnetic simulations of domain structures in thin films and bulk hard
magnets. Microsc. Microanal. 5, (Suppl. 2: Proceedings) 36-37 (1999).
BNL 65578: Friessnegg, T., Madhukar, S., Nielsen, B., Moodenbaugh,
A. R., Aggarwal, S., Keeble, D. J., Poindexter, E. H., Mascher, P., Ramesh,
R. Metal ion and oxygen vacancies in bulk and thin film La1-xSrxCoO3.
Phys. Rev. B 59(20), 13,365-13,369 (1999). Friessnegg, T., Madhukar, S.,
Nielsen, B., Moodenbaugh, A. R. , Aggarwal, S., Keeble, D. J., Poindexter,
E. H., Mascher, P., Ramesh, R. Defect identification in (La,Sr)CoO3-ä
using positron annihilation spectroscopy. MRS Proc. Symposium O,
Ferroelectric Thin Films VII, Boston, Nov. 30-Dec. 1, 1998, pp. 261-266,
Materials Research Society Proc. 541, 1999.
BNL 65886: Volkov V. and
Zhu, Y. Magnetic structure and microstructure of die-upset hard magnets
RE13.75Fe80.25B6 (RE=Nd, Pr): A possible origin of high coercivity. J.
Appl. Phys. 85, 3254-3263 (1999).
BNL 66379-AB: Volkov, V. V. and Zhu, Y.
In-situ TEM dynamic magnetizing experiments used to identify the pinning
centers in hard magnets RE13.75Fe80.25B6 (RE=Nd, Pr). Microsc. Microanal.
5, (Suppl. 2: Proceedings) 20-21 (1999).
BNL 66377-AB: Volkov, V. V. and
Zhu, Y. High coercivity mechanism of the die-upset hard magnets
RE13.75Fe80.25B6 (RE=Nd, Pr): possible correlation to specific defect
microstructure. Microsc. Microanal. 5, (Suppl. 2: Proceedings) 42-43
(1999).
BNL 66378-AB: Volkov, V. V., Crew, D. C., Zhu, Y., and Lewis, L. H.
Magnetic field calibration of the JEOL3000FEG electron microscope:
Application to studies of hard magnets. Microsc. Microanal. 5, (Suppl. 2:
Proceedings) 46-47 (1999). Wang, R. and Zhu, Y. Soft phonons and
anti-phase domains in SrTiO3: an electron diffuse scattering study. Proc.
of Microscopy & Microanalysis '99, Portland, OR, August 1-5, 1999, pp.
212-213. Wu, L., Zhu, Y., and Tafto, J. Measurements of valence electron
distribution in complex crystals: A study of oxide superconductors. Phys.
Rev. B. 59, 6035-6038 (1999).
BNL 66672: Wu, L., Zhu, Y., and Tafto, J.
Towards quantitative measurements of charge transfer in complexcrystals
using imaging and diffraction of fast electrons. Micron 30, 356-370
(1999).
BNL 66429-AB: Wu, L., Zhu, Y., Suenaga, M., and Sabatini, R. L.
Microstructure of Yba2Cu3O7-? thick films by post annealing of the
precursor by high rate e-beam deposition on SrTiO3 substrates. Microsc.
Microanal. 5, (Suppl. 2: Proceedings) 832-833 (1999).
BNL 66861: Zhu, Y.,
Wu, L., Tafto, J. A study of charge distribution in Bi2Sr2CaCu2O8+?
superconductors using novel electron-diffraction and imaging techniques.
J. of Microscopy 194(1), 21-29 (1999).
BNL 66153: Zhu, Y. and Welch, D.O.
The nature of twin boundaries in the high-temperature superconductor
Yba2Cu3O7-?. In Advance in Twinning, S.Ankem and C.S.Pande, Editors, pp.
209-222, TMS, (1999). Zhu, Y. Preface to the Special Issue on Advanced
Electron Microscopy Studies of High-Temperature Superconductors. Micron
30, 355 (1999).
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