Programme

P.3 -- Poster, VCTP-46

Date: Tuesday, 5 October 2021

Time: 08:30 - 10:00

Theoretical investigation of diffusion and electrical properties of yttria-stabilized zirconia thin film

Le Thu Lam (1), Vu Van Hung (2), Dang Thanh Hai (3), Ho Khac Hieu (4)

(1) Faculty of Natural Sciences and Technology, Tay Bac University, Sonla, Vietnam (2) VNU University of Education, 182 Luong The Vinh Street, Thanh Xuan, Hanoi, Vietnam (3) Vietnam Education Publishing House, 81 Tran Hung Dao, Hoan Kiem, Hanoi, Vietnam (4) Institute of Research and Development, Duy Tan University, 03 Quang Trung, Hai Chau, Danang 550000, Vietnam

The diffusion and electrical properties of yttria-stabilized zirconia (YSZ) thin film with fluorite structure are theoretically investigated using the statistical moment method. Our results show the lattice expansion with the thickness reduction and the diffusion coefficient and ionic conductivity of YSZ thin film with thickness ranging from 10 nm to 20 nm are more than one to two orders of magnitude enhancement in comparison with those of bulk YSZ. The thickness dependence of the lattice constant, diffusion coefficient, and ionic conductivity is attributed to the interaction potential and anharmonicity lattice vibrations occurred at the external layers. The influence of the external layers on the diffusion and electrical properties of thin film decreases with the increasing thickness and this influence is negligible with the thickness exceeding 1000 nm. The roles of substrate and grain boundary are ignored in the present study. Our study contributes to the experiments related to the effect of the external layers on the diffusion and electrical properties of YSZ thin film.

Presenter: Le Thu Lam